American Glass Research Expands Delft Glass Analysis Capabilities
The American Glass Research laboratory in the Netherlands is now home to a new, top-of-class scanning electron microscope (SEM). The Delft laboratory’s JEOL IT-510LA SEM will provide European customers with the highest level of analysis and digital data acquisition.
The SEM boasts a magnification capability of up to 300,000× and is equipped with a JEOL Energy Diffractive X-ray Spectrometer (EDX) that enables scientists to perform chemical compositional analysis of glass surfaces/substrates along with point analysis of materials or residues embedded on or within the glass. Enhanced software incorporated in this system harnesses the EDX for constant scanning of the glass surface over the entire field of view. The capability makes it possible to immediately highlight the presence of any foreign materials, facilitating quick and accurate identification.
The system incorporates a large-sized SEM chamber that allows samples up to 200 mm long and 80 mm wide to be analysed as well as low vacuum mode which circumvents the need to apply carbon or metal coating. These features permit analysis of samples with minimal alteration, which is an advantage for consumer complaints or product liability cases.
Visitors are welcome to the Delft lab to tour the laboratory and observe a demonstration of this new, advanced microscope.
Image: A scanning electron microscope compliments and expands the capabilities of the analytical services offered by the Agr Delft, Netherlands laboratory.